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Spectroscopic Ellipsometry
Spectroscopic Ellipsometry
Optical response of nanostructured GaSb
Materials Engineering / Condensed Matter Physics / Quantum Physics / Oscillations / Spectroscopic Ellipsometry / Mueller Matrix Polarimetry
High-speed, high-accuracy optical measurements of polycrystalline silicon for process control
Engineering / Technology / Scattering Theory / Physical sciences / Feedback Control / Spectroscopic Ellipsometry / Thin Solid Films / Reactive ion etching / Polycrystalline Silicon / Film Thickness / Spectroscopic Ellipsometry / Thin Solid Films / Reactive ion etching / Polycrystalline Silicon / Film Thickness
A structural study of organo-silicon polymeric thin films deposited by remote microwave plasma enhanced chemical vapour deposition
Materials Engineering / Condensed Matter Physics / Ultraviolet / Thin Film / Plasma Enhanced Chemical vapour deposition (PECVD) / Refractive Index / Optical Properties / Surface and Coatings Technology / Fourier transform infrared spectroscopy / Spectroscopic Ellipsometry / Thin film deposition / X Ray Photoelectron Spectroscopy / Refractive Index / Optical Properties / Surface and Coatings Technology / Fourier transform infrared spectroscopy / Spectroscopic Ellipsometry / Thin film deposition / X Ray Photoelectron Spectroscopy
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